The University of Hong KongUniversity Central FacilitiesInterdisciplinary and Core Research Facilities
University Central Facilities
Interdisciplinary and Core Research Facilities
The University of Hong KongLEO 1530 scanning electron microscope include GEMINI hot cathode field emission column emitter; Super resolution and high image quality at low operating voltage ~3nm at 1 KV; Wide operating voltage range 1kV to 30 KV; High probe current and stability for fast X-ray analysis; In-lens annular detector for bright, clear surface-specific image; EDS system for elemental analysis and mapping; EBSP system also includes for the microtexture determination.
Attachments / Specifications:
Person-in-charge:
Mr. Chan Y. F. Frankie - emuchan@hku.hk
The Quanta 200 3D DualBeam (FIB / SEM) is ideally suited to the industrial process control lab that must image or analyze multiple cross sections in challenging samples. For the materials science lab it offers the capability of in-situ dynamic experiments, 3D imaging and analysis and TEM sample preparation for more in-depth analysis. The Quanta 3D, with its tungsten electron column, focused ion beam column and gas injector system, is a full DualBeam offering all of the capabilities of site-specific cross sectioning, complex ion beam patterning, material deposition and etching, imaging and analysis.
Attachments / Specifications:
Person-in-charge:
Mr. Chan Y. F. Frankie - emuchan@hku.hk
Thermo Scientific Talos F200X STEM is a 200kV scanning transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging. High-resolution field emission gun (FEG) provides 1.2 Å TEM resolution and 1.6 Å STEM resolution images. Talos F200X is a strong analytical instrument that delivers fast, precise, quantitative characterization of nanomaterials in multiple dimensions. It equips with 4 in-column SDD EDS detectors, post-column energy-filtered and a high-speed CMOS camera.
Attachments / Specifications:
Person-in-charge:
Mr. Chan Y. F. Frankie - emuchan@hku.hk
Themis ETEM is an atomic resolution TEM for materials analysis with an environmental mode for in-situ TEM studies. It equips Cs image corrector that provids 0.9 Å TEM point resolution. Themis ETEM builds on the proven Titan Environmental Transmission Electron Microscope (ETEM) concept by combining both standard TEM/STEM (TEM and scanning transmission electron microscopy) and dedicated environmental TEM capabilities for time-resolved, in situ studies of the dynamic behavior of nanomaterials. The Themis ETEM is designed as a fully integrated platform for in situ experiments, such as exposing nanostructures to gaseous reaction/operating environments.
Attachments / Specifications:
Person-in-charge:
Mr. Chan Y. F. Frankie - emuchan@hku.hkProject/ Fund Source:
RGC(2019/20), Atomic-resolution Environmental Transmission Electron Microscope for Characterisation of Advanced Materials and Devices
X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material.
Escalab QXi Function included:
XPS - large area (LAXPS), small area (SAXPS), fast parallel imaging (XPI)
XPS - Monochromated Al Kα /Ag Lα Source - Ultimate Energy resolution: ≤ 0.44 eV (FEHM@Ag)
XPS - non-Monochromated Mg Kα/ Al Kα Source - Ultimate Energy resolution: ≤ 0.82 eV (FEHM@Ag)
ISS (Ion Scattering Spectroscopy) - Energy resolution: ≤ 12 eV (FEHM@Au)
REELS (Reflection Electron Energy Loss Spectroscopy) - Energy resolution: ≤ 0.5 eV (FEHM@Ag)
IPES (Inverse Photoemission Spectroscopy)
UPS (Ultraviolat Photoemission Spectroscopy) - Energy resolution: ≤ 100m eV (@Ag)
AES (Auger Electron Spectroscopy) and SAM (Scanning Augar Mapping)
SEM (Scanning Electron Microscopy) - Resolution ≤ 95 nm
Application Areas: batteries, bio-surfaces, catalysts, ceramics, glass coatings, graphene,
metals & oxides, nano-materials, OLEDs, polymers, semiconductors, solar cells, thin films etc.
Attachments / Specifications:
Person-in-charge:
Mr. Chan Y. F. Frankie - emuchan@hku.hkProject/ Fund Source:
UDF(2020/21) 020100097, Optical Characterization Facility
The BAL-TEC SCD 005 is a table-top sputter coater and produces very fine-grained, quality conductive films using precious metals: gold, gold/palladium, silver and platinum. Even large samples such as wafers for industrial processes can be coated. The BAL-TEC SCD 005 also offers single and multiple carbon thread evaporation for the production of conductive carbon films for X-ray microanalysis and carbon reinforcement films on collodion or formvar coated specimen support grids.
Person-in-charge:
Mr. Chan Y. F. Frankie - emuchan@hku.hk
The PELCO EasiGlow Glow Discharge Cleaning System is a compact, quick and easy to use standalone system. It is primarily designed for cleaning TEM grids and hydrophilization of TEM carbon support films, which have the tendency to be hydrophobic. A glow discharge treatment with air will make a carbon film surface negatively charged (hydrophilic) which allows aqueous solutions of particles to spread uniformly easily. The unit greatly facilitates projects requiring negative staining or cryo-TEM.
Person-in-charge:
Mr. Chan Y. F. Frankie - emuchan@hku.hk
Fischione Model 1051 TEM Mill is a high-performance ion milling and polishing system designed for precise specimen preparation. It produces high-quality TEM specimens with large electron transparent areas. Key features include TrueFocus ion sources for efficient milling, adjustable milling angles, in situ viewing, and specimen cooling to prevent heat-induced artifacts. This system is ideal for creating thin, electron-transparent specimens necessary for detailed TEM imaging and analysis.
Attachments / Specifications:
Fischione Model 1061 SEM Mill is a state-of-the-art ion milling and polishing system designed for high-quality scanning electron microscopy (SEM) sample preparation. It features TrueFocus ion sources, adjustable milling angles, in situ viewing, and specimen cooling. This compact and precise system consistently produces high-quality, flat surfaces in both plan-view and cross-section orientations, making it ideal for a wide variety of applications
Attachments / Specifications:
Fischione Model 200 Dimpling Grinder is a high-precision mechanical instrument designed for preparing high-quality TEM specimens. It features controlled grinding force and rate, vibration-free grinding, and precise specimen positioning. The Model 200 can flat grind and dimple polish specimens to electron transparency, making it indispensable for ion milling. It also includes an 40X microscope for direct observation
PIE Scientific Tergeo-EM is an advanced plasma cleaner designed for TEM and SEM applications. It removes hydrocarbon contamination and supports both direct and downstream plasma cleaning modes. Key features include adjustable plasma intensity, in situ viewing, and compatibility with multiple specimen holders. The system is ideal for preparing clean, hydrophilic surfaces on TEM grids and other delicate samples
