The University of Hong KongHelios 5 CX combines the innovative Elstar Electron Column for ultra-high-resolution imaging and the highest materials contrast (the resolution can reach 0.6 nm at 30 kV STEM and 15 kV and 0.9 nm at 1 kV) with the superior Tomahawk Focused Ion Beam (FIB) Column for the fastest, easiest and most precise high-quality sample preparation. It provides the most advanced electron and ion optics, the Helios 5 CX DualBeam incorporates a suite of state of-the-art technologies that enables simple and consistent high resolution S/TEM and Atom Probe Tomography (APT) sample preparation, as well as the highest-quality subsurface and 3D characterization, even on the most challenging samples.
Attachments / Specifications:
Person-in-charge:
Mr. Chan Y. F. Frankie - emuchan@hku.hkProject/ Fund Source:
BRC(2020/21)/ UDF(2020/21), Nanofabrication Facilities
The Sigma 300 VP offers ultra high resolution for both SE to image surface information and BSE to present compositional information in the high vacuum mode. Addtionally, a variable pressure (VP) mode is performed using nitrogen as imaging gas at pressures between 10 and 133 Pa. In this mode SE contrast is realised by the dedicated VPSE G4 detector and BSE contrast again by 5 segment high definition solid state BSE detector.
Person-in-charge:
Mr. Chan Y. F. Frankie - emuchan@hku.hkProject/ Fund Source:
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