The University of Hong KongThe University of Hong Kong
University Central Facilities
Interdisciplinary and Core Research Facilities

  1. Facilities
  2. Materials Charaterization Laboratory (AFM/s-SNOM/TERs)

Neaspec IR-neaSCOPE+s
AFM-IR & Nano-FTIR

The Neaspec IR-neaSCOPE offers comprehensive chemical analysis and field mapping with a spatial resolution of 10 nm. It employs advanced near-field microscopy technologies to measure both infrared (IR) absorption and reflectivity, as well as the amplitude and phase of local electromagnetic fields. The system provides IR nanoimaging, point spectroscopy, and hyperspectral analysis using continuous wave (CW) illumination sources, in addition to nano-FTIR spectroscopy with broadband lasers and synchrotron sources.

The IR-neaSCOPE+s excels in analyzing both organic and inorganic materials, showcasing the widest range of validated applications and innovative near-field methodologies, including quantitative scattering-type scanning near-field optical microscopy (s-SNOM) and sub-surface measurements.

Attachments / Specifications:

- AFM-IR - Delivers local photo-thermal sample-expansion by combining infrared pulsed-laser with AFM
- s-SNOM - Provides nanoscale absorption and reflectivity by combining VIS, IR or THz sources with AFM
- nano-FTIR - Allows for nanoscale chemical identification by combining s-SNOM with FTIR
- Tunable OPO laser source (550-7000 cm-1 [1400-18000 nm] with QCL-comparable tuning speed)
- Performance details

Person-in-charge:

Dr. Wong H. M. Karen - khmwong@hku.hk
Dr. Mo X. Y. Wing - wingxymo@hku.hk

Project/ Fund Source:

UDF(2020/21) 020100097, Optical Characterization Facility

Horiba LabRAM Odyssey Nano
AFM-Raman

Horiba LabRAM Odyssey Nano is a fully integrated AFM-Raman system based on scanning probe microscope and automated Raman micro-spectrometer. The LabRAM Odyssey Nano brings ease-of-use and extreme flexibility together for the most demanding applications. With capabilities from deep UV to infrared, high spectral resolution, and an extended set of options and accessories, the LabRAM Odyssey Nano is ideally suited to perform physical and chemical imaging.

Attachments / Specifications:

- 325 nm/25 mW laser kit, for Raman measurements from 150 to 4000 cm--1
- 532 nm/100 mW laser kit, for Raman measurements from 50 cm-1 and PL measures up to CCD limit
- 633 nm/17 mW laser kit, for Raman measurements from 50 cm-1 and PL measures up to CCD limit
- 785 nm/100 mW laser kit, for Raman measurements from 50 cm-1 and PL measures up to CCD limit
- Horiba SynapsePlus OE CCD Sensor (200 -1050 nm with a quantum efficiency > 30% between 500 nm and 900 nm), Performance details
- Linkam Temperature Stage for Raman Microscope (Temperature range: -80°C to 600°C)
- Heating stage for AFM/ AFM-Raman (Temperature up to 150°C)

Person-in-charge:

Dr. Wong H. M. Karen - khmwong@hku.hk
Dr. Mo X. Y. Wing - wingxymo@hku.hk

Project/ Fund Source:

UDF(2020/21) 020100097, Optical Characterization Facility

Bruker JPK NanoRacer/ NanoWizard 4 XP
High-Speed Atomic Force Microscope

Interchange system with two AFM scan heads -

NanoRacer AFM head is designed for use with small cantilevers. It can achieve top speeds of 50 frames/sec in fluid, in a 100nm x 100nm scan range, and with 10k pixels.

NanoWizard 4 XP extra AFM Head delivers atomic resolution and a large scan range of 100 µm in one system. It enables fast scanning with rates of up to 150 lines/sec and seamless integration with advanced optical techniques.


Person-in-charge:

Dr. Wong H. M. Karen - khmwong@hku.hk
Dr. Mo X. Y. Wing - wingxymo@hku.hk

Project/ Fund Source:

LREF(2022/23) 207300020, X-ray Single Crystal Diffractometer, X-ray Scattering System for SAXS, WAXS and GISAXS and High-Speed AFM