FEI Tecnai G2 20 S-TWIN
Scanning Transmission Electron Microscope
The easy-to-use Tecnai G2 series is designed to ensure high-quality images and facilitate the work of the microscope user. Tecnai G2 has a high level of automation without limiting full user control. Our Tecnai G2 20 S-TWIN is ready for new applications like EDS with mapping, STEM. The system has a very high diffraction acceptance angle, which makes it suitable for weak beam, tilting, and other analytical experiments. The maximum magnification is up to 910,000x with resolution ~2A.
Oxford Instruments X-Max 80T EDS Detector with AZtecTEM software
Gatan ORIUS SC600 Model 831 CCD Camera (2.7k x 2.7k pixel) with Digtalmicrograph software