The University of Hong Kong
University Central Facilities
Science and Engineering Core Service (Metaphase)

Netzsch DSC 214 Polyma
Differential Scanning Calorimeter

The NETZSCH DSC 214 Polyma measures heat flow associated with thermal transitions of a material at a controlled temperature program and is used for the determination of melting and glass transition temperatures, the grade of crystallization, heat capacity, phase transitions, decomposition points and for the kinetic consideration of chemical processes. An inline connected Intracooler 70 (IC70) , LN₂cooler and a low-mass furnace provide cooling and heating capability from -170 to 600 °C. An automatic Sample Changer (ASC) allows for consecutive measurement of up to 20 samples and references.

Attachments:

- Available Purge Gas: Nitrogen

- Available Sample Pans: Concavus Aluminum Pan and Lid

- Cooling device without LN₂: IC70 (-70°C to 600°C)

- Cooling device with LN₂: automatically controlled (-170°C to 600°C)

- Gas controller: Switches for 3 gases

Micrometritics ASAP 2020 Plus Physisorption
Accelerated Surface Area and Porosimetry System

Micrometritics ASAP 2020 Plus Physisorption deliveries a high-performance adsorption analyzer for measuring surface area, pore size, and pore volume of powders and porous materials. Standard methods or user customized protocols can be used to characterize adsorbents, catalysts, zeolites, MOFs, APIs, excipients, and a wide variety of porous and non-porous materials. The ASAP 2020 Plus is ideally suited for gas adsorption analysis of microporous (0.35 to 2nm) and mesoporous (2 to 50nm) materials and delivers superior accuracy, resolution and data reduction.

Attachments:

- Available Adsorptive Gas: Nitrogen, Helium, Argon

- Vapor Sorption Option

Cameca LEAP 6000 XR
Atom Probe Tomography

Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science.

The sample is prepared in the form of a very sharp tip. The cooled tip is biased at high DC voltage (3-15 kV). The very small radius of the tip and the High Voltage induce a very high electrostatic field (tens V/nm) at the tip surface, just below the point of atom evaporation. Under laser or HV pulsing, one or more atoms are evaporated from the surface, by field effect (near 100% ionization), and projected onto a Position Sensitive Detector (PSD) with a very high detection efficiency. Ion efficiencies are as high as 80%, the highest analytical efficiency of any 3D microscopy.

Cameca LEAP 6000 XR APT inherits key features from previous APT generations, adding deep UV laser pulsing to the proven local electrode design to deliver higher yield and data quality. Through compatibility with the microtip array and a redesigned optical system, the LEAP 6000 XR provides enhanced ease of use and the potential for fully automated operation.