The University of Hong Kong
University Central Facilities
Science and Engineering Core Service (Metaphase)

Neaspec IR-neaSCOPE+s
AFM-IR & Nano-FTIR

Neaspec IR-neaSCOPE providing complete chemical analysis and field mapping at 10 nm spatial resolution. It utilizes state-of-the-art technologies of near-field microscopy to measure both IR absorption and reflectivity, as well as amplitude and phase of local electromagnetic fields. It provides IR nanoimaging, point-spectroscopy and hyperspectral analysis with CW illumination sources as well as nano-FTIR spectroscopy using broadband lasers and synchrotron sources. IR-neaSCOPE+s excels in both organic and inorganic materials analysis providing the broadest range of demonstrated applications and novel near-field methodologies such as quantitative s-SNOM or sub-surface measurements.

Attachments:

- AFM-IR - Delivers local photo-thermal sample-expansion by combining infrared pulsed-laser with AFM

- s-SNOM - Provides nanoscale absorption and reflectivity by combining VIS, IR or THz sources with AFM

- nano-FTIR (coming soon) - Allows for nanoscale chemical identification by combining s-SNOM with FTIR

- Tunable OPO laser source (550-7000 cm^-1 [1400-18000 nm] with QCL-comparable tuning speed) Performance details

Horiba LabRAM Odyssey Nano
AFM-Raman

Horiba LabRAM Odyssey Nano is a fully integrated AFM-Raman system based on scanning probe microscope and automated Raman micro-spectrometer. The LabRAM Odyssey Nano brings ease-of-use and extreme flexibility together for the most demanding applications. With capabilities from deep UV to infrared, high spectral resolution, and an extended set of options and accessories, the LabRAM Odyssey Nano is ideally suited to perform physical and chemical imaging.

Attachments:

- 325 nm/25 mW laser kit, for Raman measurements from 150 to 4000 cm-^-1

- 532 nm/100 mW laser kit, for Raman measurements from 50 cm^-1 and PL measures up to CCD limit

- 633 nm/17 mW laser kit, for Raman measurements from 50 cm^-1 and PL measures up to CCD limit

- 785 nm/100 mW laser kit, for Raman measurements from 50 cm^-1 and PL measures up to CCD limit

- Horiba SynapsePlus OE CCD Sensor (200 -1050 nm with a quantum efficiency > 30% between 500 nm and 900 nm), Performance details

- Linkam Temperature Stage for Raman Microscope (Temperature range: -80°C to 600°C)

- Heating stage for AFM/ AFM-Raman (Temperature up to 150°C)

Bruker JPK NanoRacer/ NanoWizard 4 XP
High-Speed Atomic Force Microscope

Interchange system with two AFM scan heads
NanoRacer AFM head is designed for use with small cantilevers. It can achieve top speeds of 50 frames/sec in fluid, in a 100nm x 100nm scan range, and with 10k pixels.
NanoWizard 4 XP extra AFM Head delivers atomic resolution and a large scan range of 100 µm in one system. It enables fast scanning with rates of up to 150 lines/sec and seamless integration with advanced optical techniques.